• DocumentCode
    2738481
  • Title

    Effect of Percolation on Electrical Conductivity in a Carbon Nanotube-Based Film Radiation Sensor

  • Author

    Ma, Jiazhi ; Yeow, John T W ; Chow, James C L ; Barnett, Rob B.

  • Author_Institution
    Dept. of Syst. Design Eng., Waterloo Univ., Waterloo, ON
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    259
  • Lastpage
    262
  • Abstract
    Devices based on carbon nanotube (CNT) films offer advantages over devices based on single CNT due to their ease of manufacture, good reproducibility, and high efficiency. A good understanding on percolation properties of CNT films is essential in the design of CNT-based film devices. In this paper, the effect of percolation on electrical conductivity in a CNT-based film radiation sensor was studied. CNT films with different densities were prepared to find the relationship between the film conductivity and the CNT density in the film. The effect of CNTs´ length on the critical density of the film was also discussed based on percolation theory. The average length of CNTs determines the critical density of the film and in turn governs the film conductivity. For the CNT-based film radiation sensor, larger responses were achieved when the CNT film was prepared with 3 layers of CNTs. In general, it is expected that by using the unique properties of CNT films within the percolation region, devices based on such films can achieve superior performances.
  • Keywords
    carbon nanotubes; electrical conductivity; microsensors; nanotube devices; particle detectors; percolation; C; CNT density; carbon nanotube-based film radiation sensor; electrical conductivity; percolation; Cancer; Carbon nanotubes; Coatings; Conductive films; Conductivity; Hospitals; Manufacturing; Mechanical sensors; Reproducibility of results; Rivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, Texas
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.83
  • Filename
    4617065