DocumentCode
2738657
Title
Photon antibunching from a single lithographically defined InGaAs/GaAs quantum dot
fYear
2011
fDate
10-12 Jan. 2011
Firstpage
19
Lastpage
20
Abstract
We demonstrate photon antibunching from a single lithographically defined quantum dot. Measurement of the second order autocorrelation function indicates g(2)(0) = 0.395 ± 0.030, below the 0.5 limit necessary for classification as a single photon source.
Keywords
III-V semiconductors; electron beam lithography; gallium arsenide; indium compounds; optical fabrication; photon antibunching; semiconductor quantum dots; InGaAs-GaAs; photon antibunching; second order autocorrelation function; single lithographically defined quantum dot; Correlation; Fabrication; Gallium arsenide; Information processing; Measurement by laser beam; Photonics; Quantum dots;
fLanguage
English
Publisher
ieee
Conference_Titel
Winter Topicals (WTM), 2011 IEEE
Conference_Location
Keystone, CO
Print_ISBN
978-1-4244-8428-7
Type
conf
DOI
10.1109/PHOTWTM.2011.5730025
Filename
5730025
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