• DocumentCode
    2738716
  • Title

    Measuring the Capacitance of Electrical Wiring and Humans for Proximity Sensing with Existing Electrical Infrastructure

  • Author

    Buller, William ; Wilson, Brian

  • Author_Institution
    Altarum Inst., Ann Arbor, MI
  • fYear
    2006
  • fDate
    7-10 May 2006
  • Firstpage
    93
  • Lastpage
    96
  • Abstract
    In a recent series of electric field sensing experiments, a Theremin was used to measure the mutual capacitance between a human being and a length of electrical wiring. The instrument, based on the LM555 circuit, measures the deflections in capacitance due to the proximity of a human. The measurements are repeatable, and the difference in capacitance for a person at one-half meter with a person at one meter is consistent with the difference computed assuming the human acts as a ground plane for the wiring. Much of the current literature in electric field sensing focuses on measures and models of mutual capacitance for humans interacting with plate conductors, especially fingers near touch screens. Our investigation considers conducting wires to allow development of portable, rapidly deployable human proximity sensing systems that exploit existing electrical infrastructure in buildings. The experiment described here demonstrates that sensing with wires is possible at ranges on the order of a meter and provides evidence that modeling the person as a ground plane of finite extent provides a rough estimate of the change in mutual capacitance
  • Keywords
    capacitance measurement; electric field effects; electric field measurement; wiring; Theremin; capacitance measurement; electric field effects; electric field measurement; electrical wiring; human proximity sensing systems; mutual capacitance; plate conductors; touch screens; Anthropometry; Capacitance measurement; Circuits; Current measurement; Electric variables measurement; Humans; Instruments; Length measurement; Wires; Wiring; Capacitance measurement; Theremin; electric field effects; electric field measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/information Technology, 2006 IEEE International Conference on
  • Conference_Location
    East Lansing, MI
  • Print_ISBN
    0-7803-9592-1
  • Electronic_ISBN
    0-7803-9593-X
  • Type

    conf

  • DOI
    10.1109/EIT.2006.252172
  • Filename
    4017676