DocumentCode
2738932
Title
Building Blocks for Fluctuation Based Calculation in Single Electron Tunneling Technology
Author
Safiruddin, Saleh ; Cotofana, Sorin ; Peper, Ferdinand ; Lee, Jia
Author_Institution
Comput. Eng. Lab., Delft Univ. of Technol., Delft
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
358
Lastpage
361
Abstract
Fluctuations and noise are important factors interfering with the operation of devices and circuits, and this effect will become stronger as feature sizes decrease. This paper presents two building blocks for single electron tunneling (SET) circuits that are designed with signal fluctuations in mind. One of these blocks, a so-called Hub, outputs its signals to other building blocks by repeatedly offering its signals at its output terminals, and taking them back when they cannot be delivered. Based on a random scheme of signaling, the Hub requires fluctuations to drive its operation. The other building block, a Conservative Join, is designed to work in cooperation with the Hub, though it does not require fluctuations. We propose SET circuit topologies for both blocks, and analyze their behavior at a temperature of IK by computer simulations with SIMON 2.0. The two very different modes of operation in the blocks-fluctuation vs. non-fluctuating-can be accommodated by appropriately tuning circuit parameters, as we show. Utilizing these proposed topologies we then present an example of a network constructed using the two building blocks.
Keywords
electron device noise; fluctuations; single electron devices; tunnelling; SET circuit topologies; SIMON 2.0 simulations; circuit parameters; fluctuation based calculation; noise; signal fluctuations; single electron tunneling technology; temperature 1 K; Circuit noise; Circuit optimization; Circuit topology; Computer simulation; Electrons; Fluctuations; Network topology; Signal design; Temperature; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.111
Filename
4617093
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