• DocumentCode
    273904
  • Title

    Drift reliability optimization: problem formulation and its algorithmic solution

  • Author

    Styblinski, M.A.

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • fYear
    1989
  • fDate
    5-8 Sep 1989
  • Firstpage
    517
  • Lastpage
    521
  • Abstract
    In this paper the drift reliability optimization problem is formulated and some algorithmic aspects of its solution discussed. It is shown that it is possible to formulate the problem in such a way that both manufacturing yield and the average time to fail (due to system element drift) can be maximized, and different trade-off situations investigated. Moreover, the existing yield optimization algorithms can be used after only some minor modifications
  • Keywords
    optimisation; reliability; algorithmic aspects; algorithmic solution; drift reliability optimization problem; manufacturing yield; problem formulation; trade-off situations; yield optimization;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Circuit Theory and Design, 1989., European Conference on
  • Conference_Location
    Brighton
  • Type

    conf

  • Filename
    51673