Title :
Quasi-optical Material Measurements with Help of Diffractive Optics
Author :
Minin, I.V. ; Minin, O.V.
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk
Abstract :
The monitoring of the composition of materials is an important problem of applied spectroscopy using optical, infrared, microwave and THz wavelength bands. MM and THz waves ensure better spatial resolution than microwaves and they can be used for material testing in media that are opaque for optical and infrared radiation. Whenever dielectric components are used in MM and THz wavebands, a precise knowledge of the dielectric properties of the material is essential. The developments original setups for dielectric material probing simultaneously at several discrete wavelengths within the same local zone are described.
Keywords :
dielectric materials; diffractive optical elements; materials testing; microwave photonics; millimetre wave devices; optical materials; submillimetre wave devices; MM wavebands; THz wavebands; dielectric components; dielectric material testing; diffractive optical element; infrared radiation; material composition monitoring; optical radiation; quasioptical material measurements; spatial resolution; Composite materials; Dielectric materials; Infrared spectra; Infrared surveillance; Monitoring; Optical diffraction; Optical materials; Spatial resolution; Spectroscopy; Wavelength measurement;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368509
