DocumentCode
2739288
Title
Dynamic power optimization of contoured flexible PV array under Non-Uniform Illumination conditions
Author
Sharma, P. ; Patnaik, B. ; Duttagupta, S.P. ; Agarwal, V.
Author_Institution
Dept. of Electr. Eng., Indian Inst. of Technol. Bombay, Mumbai, India
fYear
2010
fDate
20-25 June 2010
Abstract
Lightweight, flexible PV (FPV) modules are suitable for BIPV and stand-alone applications where contoured layouts are required and system weight is a constraint. This report focuses on optimization of a contoured FPV array which operates under Non Uniform Illumination (NUI) conditions. NUI conditions can occur at low solar angle for contoured layouts and also due to unexpected partial shading events. The output Power Voltage (P-V) characteristics under contouring and partial shading demonstrate severe oscillatory behavior around the maximum power region, which results in inefficient implementation of established tracking algorithms that seek to detect a dominant global maxima. An algorithm for MPP tracking has been proposed that takes into account both static and dynamic parameters. An integrated test system has been developed which can accurately monitor solar irradiance (range 100-1000 Watts/m2) and solar angle and load dependent instantaneous output voltage and current. The system has been designed for maximum current and voltage rating of 3A and 25V respectively. While an output power penalty results due to contouring, our results show a very small energy differential up to a maximum array contour value of 10°. This analysis may lead to development of novel, flexible PV array based designs.
Keywords
maximum power point trackers; photovoltaic power systems; MPP tracking; contoured flexible PV array; dynamic power optimization; integrated test system; nonuniform illumination conditions; oscillatory behavior; output power voltage characteristics; partial shading; solar irradiance; Power supplies; Programmable logic arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location
Honolulu, HI
ISSN
0160-8371
Print_ISBN
978-1-4244-5890-5
Type
conf
DOI
10.1109/PVSC.2010.5614565
Filename
5614565
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