DocumentCode
2739313
Title
Current Status and Future Perspectives of Carbon Nanotube Interconnects
Author
Banerjee, Kaustav ; Li, Hong ; Srivastava, Navin
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
432
Lastpage
436
Abstract
In this paper, we review the current status of CNT interconnect research, from both fabrication and modeling aspects. The fabrication issues of vertical and horizontal CNT interconnects and remaining challenges are discussed. State-of-the-art in both SWCNT and MWCNT modeling and performance analysis are presented. In addition, high-frequency effects, off-chip application, and process variation of CNT interconnects have also been discussed.
Keywords
carbon nanotubes; high-frequency effects; integrated circuit interconnections; integrated circuit modelling; nanoelectronics; nanotube devices; C; MWCNT; SWCNT; high-frequency effects; horizontal carbon nanotube interconnects; off-chip application; vertical carbon nanotube interconnects; Carbon nanotubes; Current density; Fabrication; Large scale integration; Performance analysis; Scattering; Semiconductivity; Surface resistance; Thermal conductivity; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.132
Filename
4617114
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