DocumentCode
2739615
Title
Temperature dependence of photoluminescence in Mg-doped GaN epilayers grown by MOCVD
Author
Shin, Eun-joo ; Viswanath, A.Kasi ; Lee, Joo In ; Song, Nam Woong ; Kim, Dongho ; Kim, Baeyong ; Choi, Yoonho ; Hong, Chang-Hee
Author_Institution
Spectrosc. Lab., Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
fYear
1997
fDate
8-11 Sep 1997
Firstpage
215
Lastpage
218
Abstract
High quality magnesium doped GaN epitaxial layers on sapphire substrate were achieved by the rotating disk MOCVD. Energy levels of these acceptors were investigated by temperature dependent photoluminescence measurements. Magnesium concentration was varied from <1×1019 to higher than 5×1019 cm -3. In the samples with lower magnesium concentration we have observed free excitonic transitions and the donor-acceptor pair transition with its phonon replicas. For the samples with higher magnesium concentration the spectra were dominated by acceptor related transitions. In this study, we could not see any deep level luminescence even in highly Mg-doped GaN and free excitonic transitions were observed in doped materials. These facts show the high quality of samples
Keywords
III-V semiconductors; gallium compounds; magnesium; photoluminescence; semiconductor epitaxial layers; wide band gap semiconductors; GaN:Mg; GaN:Mg epilayers; MOCVD; donor-acceptor pair transition; energy levels; free excitonic transitions; photoluminescence; rotating disk MOCVD; Energy measurement; Energy states; Epitaxial layers; Gallium nitride; MOCVD; Magnesium; Photoluminescence; Substrates; Temperature dependence; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location
San Diego, CA
Print_ISBN
0-7503-0556-8
Type
conf
DOI
10.1109/ISCS.1998.711619
Filename
711619
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