DocumentCode :
2739637
Title :
Steps Towards Fabricating Cryogenic CMOS Compatible Single Electron Devices
Author :
Eng, K. ; Eyck, G. A Ten ; Tracy, L. ; Nordberg, E. ; Childs, K. ; Stevens, J. ; Wendt, J.R. ; Lilly, M.P. ; Carroll, M.S.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
496
Lastpage :
499
Abstract :
We describe the development of a novel silicon quantum bit (qubit) device architecture that involves using materials that are compatible with a Sandia National Laboratories (SNL) 0.35 mum complementary metal oxide semiconductor (CMOS) process intended to operate at 100 mK. We describe how the qubit structure can be integrated with CMOS electronics, which is believed to have advantages for critical functions like fast single electron electrometry for readout compared to current approaches using radio frequency techniques. Critical materials properties are reviewed and preliminary characterization of the SNL CMOS devices at 4.2 K is presented.
Keywords :
CMOS integrated circuits; elemental semiconductors; silicon; single electron devices; Si; complementary metal oxide semiconductor; cryogenic CMOS compatible single electron devices; radio frequency techniques; silicon quantum bit; single electron electrometry; temperature 4.2 K; CMOS process; Cryogenics; Gallium arsenide; Laboratories; Quantum computing; Quantum dots; Radio frequency; Silicon; Single electron devices; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.149
Filename :
4617131
Link To Document :
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