• DocumentCode
    2739653
  • Title

    Effective Test Driven Development for Embedded Software

  • Author

    Karlesky, Michael J. ; Bereza, William I. ; Erickson, Carl B.

  • Author_Institution
    Atomic Object LLC
  • fYear
    2006
  • fDate
    7-10 May 2006
  • Firstpage
    382
  • Lastpage
    387
  • Abstract
    Methodologies for effectively managing software development risk and producing quality software are taking hold in the IT industry. However, similar practices for embedded systems, particularly in resource constrained systems, have not yet become prevalent. Today, quality in embedded software is generally tied to platform-specific testing tools geared towards debugging. We present here an integrated collection of concrete concepts and practices that are decoupled from platform-specific tools. In fact, our approach drives the actual design of embedded software. These strategies yield good design, systems that are testable under automation, and a significant reduction in software flaws. Examples from an 8 bit system with 16k of program memory and 255 bytes of RAM illustrate these ideas
  • Keywords
    design for quality; design for testability; embedded systems; program debugging; program testing; software quality; 255 Bytes; IT industry; RAM; debugging; design for testability; embedded systems; microprogramming; platform-specific testing tools; program memory; resource constrained systems; software development risk; software flaws; software quality; software testing; Computer industry; Debugging; Embedded software; Embedded system; Programming; Quality management; Risk management; Software development management; Software quality; Software testing; Design for testability; Microprogramming; Software quality; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electro/information Technology, 2006 IEEE International Conference on
  • Conference_Location
    East Lansing, MI
  • Print_ISBN
    0-7803-9592-1
  • Electronic_ISBN
    0-7803-9593-X
  • Type

    conf

  • DOI
    10.1109/EIT.2006.252188
  • Filename
    4017725