• DocumentCode
    2739664
  • Title

    Characterization of a New Epoxy Resin System for Thermal Management Application

  • Author

    Chen, Wen-Ren ; Chen, Jeng-I

  • Author_Institution
    ITEQ Corp., Taoyuan
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    224
  • Lastpage
    227
  • Abstract
    In this study, a resin mixture based on bisphenol-A epoxy and a new curing agent was prepared. The new curing agent contains both imide and amine functional groups. The physical properties of the material based on the new resin system including Tg, peel strength, solder float (288degC), Td (5%) were investigated. It was found the peel strength of copper substrate with the new curing agent system is better than the one with a PN-cured material. Meanwhile, the same substrate with the new curing agent would bear much more time in the solder float test than the one with a Dicy-cured system. High thermal conductive inorganic filler was added in this new system and its thermal conductive property was also studied. A new method was developed to compare the thermal conductivity of various materials. It was also found the thermal conductivity of the substrate with a high content of filler was comparable with those of the commercial products. The newly developed material can be used as a heat transfer medium for various thermal management applications in PCB and LED industries.
  • Keywords
    adhesion; copper; curing; plastic deformation; polymers; silicon compounds; solders; thermal conductivity; Cu; SiC; amine functional group; bisphenol-A epoxy; copper substrate; curing agent; dicyandiamide-cured system; epoxy resin system; heat transfer medium; high thermal conductive inorganic filler; imide functional group; peel strength; physical properties; plastic deformation; resin mixture; solder float test; temperature 288 C; thermal management application; Ceramics; Conducting materials; Copper; Curing; Dielectric materials; Dielectric substrates; Epoxy resins; Thermal conductivity; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3623-1
  • Electronic_ISBN
    978-1-4244-3624-8
  • Type

    conf

  • DOI
    10.1109/IMPACT.2008.4783850
  • Filename
    4783850