DocumentCode
2739664
Title
Characterization of a New Epoxy Resin System for Thermal Management Application
Author
Chen, Wen-Ren ; Chen, Jeng-I
Author_Institution
ITEQ Corp., Taoyuan
fYear
2008
fDate
22-24 Oct. 2008
Firstpage
224
Lastpage
227
Abstract
In this study, a resin mixture based on bisphenol-A epoxy and a new curing agent was prepared. The new curing agent contains both imide and amine functional groups. The physical properties of the material based on the new resin system including Tg, peel strength, solder float (288degC), Td (5%) were investigated. It was found the peel strength of copper substrate with the new curing agent system is better than the one with a PN-cured material. Meanwhile, the same substrate with the new curing agent would bear much more time in the solder float test than the one with a Dicy-cured system. High thermal conductive inorganic filler was added in this new system and its thermal conductive property was also studied. A new method was developed to compare the thermal conductivity of various materials. It was also found the thermal conductivity of the substrate with a high content of filler was comparable with those of the commercial products. The newly developed material can be used as a heat transfer medium for various thermal management applications in PCB and LED industries.
Keywords
adhesion; copper; curing; plastic deformation; polymers; silicon compounds; solders; thermal conductivity; Cu; SiC; amine functional group; bisphenol-A epoxy; copper substrate; curing agent; dicyandiamide-cured system; epoxy resin system; heat transfer medium; high thermal conductive inorganic filler; imide functional group; peel strength; physical properties; plastic deformation; resin mixture; solder float test; temperature 288 C; thermal management application; Ceramics; Conducting materials; Copper; Curing; Dielectric materials; Dielectric substrates; Epoxy resins; Thermal conductivity; Thermal management; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location
Taipei
Print_ISBN
978-1-4244-3623-1
Electronic_ISBN
978-1-4244-3624-8
Type
conf
DOI
10.1109/IMPACT.2008.4783850
Filename
4783850
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