DocumentCode
2739665
Title
Nondestructive Testing of Paint Thickness Measurement by Pulsed Infrared Thermography
Author
Bo, LIU ; Cun-Lin, Zhang ; Jing-ling, Shen ; Li-chun, Feng ; Ning, Tao ; Yan-hong, Li ; You-fu, Ding ; Si-chao, Shi ; Yi-guang, Xu ; Yan, Huo ; Shi-bin, Zhao ; Wei-chao, Xu ; Xiao-Yan, Zhang
Author_Institution
Capital Normal Univ., Beijing
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
323
Lastpage
323
Abstract
In this paper, basic principles of active IR thermography are introduced, paints covered sample is excited by exterior energy with ordinary flashing lamps array, the subsequent change of surface temperature of the sample is monitored by an infrared camera, and sequence of thermal wave signal and data acquisition are processed using the computer, then real-time image signal processing and the analysis were carried on by the special software. Finally using the algorithm, the paint level thickness information can be obtained. The setup of IR NDT system and the new heat excitation-device were presented, especially including creation of key part, i.e. the heat excitation-device which was invented by self in laboratory. Comparing with heating equipment of thermal wave imaging (TWI) imported from US, it has some merits such as lower expense, narrower pulse width, lower power loss and so on.
Keywords
heat conduction; infrared imaging; nondestructive testing; paints; thickness measurement; IR NDT system; data acquisition; heat excitation-device; heating equipment; infrared camera; nondestructive testing; ordinary flashing lamps array; paint sample surface temperature; paint thickness measurement; pulsed infrared thermography; real-time image signal processing; thermal wave imaging; thermal wave signal sequence; Computerized monitoring; Lamps; Nondestructive testing; Paints; Photothermal effects; Pulse measurements; Signal processing algorithms; Surface waves; Temperature; Thickness measurement; NDT; Paint thickness; Pulsed IR thermography;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368531
Filename
4222265
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