DocumentCode
2739694
Title
Modeling the Reliability of Existing Software using Static Analysis
Author
Schilling, Walter W.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Toledo Univ., OH
fYear
2006
fDate
7-10 May 2006
Firstpage
366
Lastpage
371
Abstract
Software unreliability represents an increasing risk to overall system reliability. As systems become larger and more complex, mission critical and safety critical systems have had increasing functionality controlled exclusively through software. This change, coupled with generally increasing reliability in hardware modules, has resulted in a shift of the root cause of systems failure from hardware to software. Market forces, including decreased time to market, reduced development team sizes, and other factors, have encouraged projects to reuse existing software as well as to purchase COTS software solutions. This has made the usage of the more than 200 existing software reliability models increasingly difficult. Traditional software reliability models require significant testing data to be collected during software development in order to estimate software reliability. If this data is not collected in a disciplined manner or is not made available to software engineers, these modeling techniques can not be applied. It is imperative that practical reliability modeling techniques be developed to address these issues. It is on this premise that an appropriate software reliability model combining static analysis of existing source code modules, limited testing with path capture, and Bayesian belief networks is presented. Static analysis is used to detect faults within the source code which may lead to failure. Code coverage is used to determine which paths within the source code are executed as well as how often they execute. Finally, Bayesian belief network is then used to combine these parameters and estimate the resulting software reliability
Keywords
belief networks; program diagnostics; software reliability; Bayesian belief networks; mission critical systems; safety critical systems; software development; software reliability; static analysis; system reliability; systems failure; Bayesian methods; Control systems; Data engineering; Hardware; Mission critical systems; Programming; Software reliability; Software safety; Software testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Electro/information Technology, 2006 IEEE International Conference on
Conference_Location
East Lansing, MI
Print_ISBN
0-7803-9592-1
Electronic_ISBN
0-7803-9593-X
Type
conf
DOI
10.1109/EIT.2006.252191
Filename
4017728
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