DocumentCode
2739716
Title
TID performance degradation of high precision, 16-bit analog-to-digital converters
Author
Layton, Phil ; Williamson, Gale ; Patnaude, Ed ; Longden, Larry ; Thibodeau, Chad ; Kazak, Boris ; Sloan, Clarence
Author_Institution
Maxwell Technol., San Diego, CA, USA
fYear
2003
fDate
21-25 July 2003
Firstpage
6
Lastpage
10
Abstract
16-bit analog-to-digital (A/D) converters were evaluated for performance and linearity degradation due to the total dose induced shifts in the voltage reference. Test data and analysis of three A/D converters is presented.
Keywords
analogue-digital conversion; integrated circuit testing; performance evaluation; reference circuits; 16-bit analog-to-digital converters; TID performance; high precision converters; linearity degradation evaluation; performance evaluation; total dose induced shifts; total ionizing dose; voltage reference; Analog-digital conversion; Circuits; Data analysis; Degradation; Linearity; Performance evaluation; Production; Protection; Software testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN
0-7803-8127-0
Type
conf
DOI
10.1109/REDW.2003.1281314
Filename
1281314
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