• DocumentCode
    2739718
  • Title

    The effect of deposition conditions on the atomic oxygen induced degradation of MgF2 anti-reflective coatings

  • Author

    Ianno, N.J. ; Speckman, D.M.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Nebraska, Lincoln, NE, USA
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    Spacecraft orbiting below about 800 km are exposed to a high flux of atomic oxygen (AO) that can severely degrade surface materials. Of particular concern are the anti-reflective (AR) coating on solar array surfaces that not only protect the solar panel from the environment but help to boost the transmission of incoming light to the solar cells. Degradation of this AR coating can have serious effects on the performance of the solar panels, leading to insufficient power being available to perform any useful mission. A common space borne solar cell cover consists of a Ceria (CeO2) doped borosilicate glass (CMG) substrate coated by a 90nm MgF2 AR coating. Our previous work has shown that the transmission of commercially purchased MgF2 anti-reflective coatings degrades significantly when exposed to an AO flux. In view of this MgF2 films were deposited in-house where the deposition conditions were controlled. MgF2 films were deposited on ceria micro sheet substrates via electron beam evaporation. The system base pressure 2.3 × 10 - 6 torr without the use of the liquid nitrogen (LN2) trap and <;5 × 10 - 7 torr when the LN2 trap is cooled. The thickness of the film was monitored by a quartz crystal microbalance and the substrate was mounted on a temperature controlled heater block. The source material was commercially purchased MgF2 granules. The as-deposited and AO exposed films were analyzed via spectroscopic ellipsometry, x-ray diffractometry and auger electron spectroscopy. We will show that the transmission degradation can be reduced by an order of magnitude, without significantly changing the optical properties of the film, by controlling the oxygen content of the as-deposited film.
  • Keywords
    Auger electron spectroscopy; antireflection coatings; cerium compounds; ellipsometry; magnesium compounds; solar cells; space vehicles; AO exposed films; AR coating; Auger electron spectroscopy; CeO2; MgF2; X-ray diffractometry; antireflective coatings; as-deposited films; atomic oxygen induced degradation; ceria doped borosilicate glass substrate; ceria microsheet substrates; deposition conditions; electron beam evaporation; optical properties; oxygen content; quartz crystal microbalance; size 90 nm; solar array surfaces; solar cells; solar panel; source material; space borne solar cell cover; spacecraft; spectroscopic ellipsometry; surface materials; temperature controlled heater block; transmission degradation; Coatings; Degradation; Optical diffraction; Optical films; Spectroscopy; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614585
  • Filename
    5614585