• DocumentCode
    2739937
  • Title

    The electromagnetic leakage of the bounded-wave EMP simulator during the simulation of LEMP

  • Author

    Wang, Wei ; Chen, Bin ; Zhou, Bihua

  • Author_Institution
    Nat. Key Lab. on Electromagn. Environ. Effects & Electro-Opt. Eng., PLA Univ. of Sci. & Tech., Nanjing, China
  • fYear
    2011
  • fDate
    1-4 Nov. 2011
  • Firstpage
    292
  • Lastpage
    295
  • Abstract
    Bounded-wave EMP Simulator is often used in the simulation of the lightning electromagnetic environment. When simulate the lightning electromagnetic environment EMP simulator is working in the environment of high voltage and high field intensity. The simulator has an opening structure, and it will inevitably bring a certain radiation to its surroundings. The effect imposed onto the electronic equipment by the leak of the simulator should be considered. In this paper, the leakage of the EMP simulator is analyzed. Two states were taken into consideration: when the simulator is unloaded and when the equipment under-test (EUT) is placed in the simulator. The numerical result shows that the field intensity of the leakage falls rapidly as the distance from the simulator edge increase. When the distance from the working region of the simulator is more than 3.5m, the radiation field is less than twenty percent of the edge.
  • Keywords
    atmospheric electromagnetic wave propagation; atmospheric techniques; lightning; LEMP simulation; bounded-wave EMP simulator; electromagnetic leakage; electronic equipment; equipment under-test; high field intensity; high voltage environment; leakage field intensity; lightning electromagnetic environment; simulator edge; Computational modeling; Difference equations; Finite difference methods; Lightning; Metals; Time domain analysis; Bounded-wave EMP Simulator; LEMP; electromagnetic leakage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lightning (APL), 2011 7th Asia-Pacific International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4577-1467-2
  • Type

    conf

  • DOI
    10.1109/APL.2011.6110128
  • Filename
    6110128