DocumentCode :
2740106
Title :
Permanent Non-Etching Adhesion Promotion System for Solder Mask Applications
Author :
Kumashiro, S. ; Massey, R. ; Huelsmann, T. ; Sparing, C.
Author_Institution :
Atotech (China) Chem., Guangzhou
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
311
Lastpage :
313
Abstract :
With the constant drive for miniaturization in the IC substrate market, and the increasing performance demands being made on completed assemblies, the use of etch based adhesion promoter systems is coming into question. Unlike the current technology, Atotech´s SecureTM HFz process enhances the adhesion between a Copper conductor and a solder mask with no etching to the conductor itself. This unique approach is designed to meet the current and future market requirements typical to ultra fine line IC substrate manufacturing (sub 10/10 mum line and spaces can be achieved). This work details the SecureTM HFz process and discusses testing carried out, in which, the adhesion properties are attained for treated surfaces and a range of solder mask materials. The tests show that surfaces treated with this non-etching chemistry exhibit comparable or greater adhesion strength when compared to a traditional etching based system. Long term reliability is also evaluated through HAST (Highly Accelerated Stress Test) where again overall performance is equivalent to, or better than the current etch based process. The summary of this work is that Copper surfaces treated with the SecureTM HFz process offer a technical advantage in ultrafine line and space applications due to their improved adhesion to solder mask materials with no changes, critically reduction, in overall track geometry.
Keywords :
adhesion; adhesive bonding; copper; etching; integrated circuit bonding; masks; materials testing; soldering; solders; Atotech Secure HFz process; Cu; adhesion strength; copper conductor; highly-accelerated stress test; permanent nonetching adhesion promotion system; reliability; solder mask applications; space applications; surface treatment; ultrafine line IC substrate manufacturing; Adhesives; Assembly systems; Chemistry; Conductors; Copper; Etching; Manufacturing; Materials testing; Surface treatment; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3623-1
Electronic_ISBN :
978-1-4244-3624-8
Type :
conf
DOI :
10.1109/IMPACT.2008.4783873
Filename :
4783873
Link To Document :
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