• DocumentCode
    2740150
  • Title

    TMO: A new class of attack on cipher misusing test infrastructure

  • Author

    Ali, Sk Subidh ; Sinanoglu, Ozgur

  • Author_Institution
    New York Univ. Abu Dhabi (NYUAD), Abu Dhabi, United Arab Emirates
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We present a new class of scan attack on hardware implementation of ciphers. The existing scan attacks on ciphers exploit the Design for Testability (DfT) infrastructure of the implementation, where an attacker applies cipher inputs in the functional mode and then by switching to the test mode retrieves the secret key in the form of test responses. These attacks can be thwarted by applying a reset operation when there is a switch of mode. However, the mode-reset countermeasure can be thwarted by using only the test mode of a secure chip. In this work we show how a Test-Mode-Only (TMO) attack can overcome the constraints imposed by a mode-reset countermeasure and demonstrate TMO attacks on private key as well as public key ciphers.
  • Keywords
    design for testability; private key cryptography; public key cryptography; DfT infrastructure; TMO attack; design for testability; hardware implementation; mode-reset countermeasure; private key ciphers; public key ciphers; reset operation; scan attack; secret key; secure chip; test infrastructure; test responses; test-mode-only attack; Ciphers; Elliptic curve cryptography; Hardware; Registers; Standards; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Conference_Location
    Napa, CA
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116255
  • Filename
    7116255