Title :
TMO: A new class of attack on cipher misusing test infrastructure
Author :
Ali, Sk Subidh ; Sinanoglu, Ozgur
Author_Institution :
New York Univ. Abu Dhabi (NYUAD), Abu Dhabi, United Arab Emirates
Abstract :
We present a new class of scan attack on hardware implementation of ciphers. The existing scan attacks on ciphers exploit the Design for Testability (DfT) infrastructure of the implementation, where an attacker applies cipher inputs in the functional mode and then by switching to the test mode retrieves the secret key in the form of test responses. These attacks can be thwarted by applying a reset operation when there is a switch of mode. However, the mode-reset countermeasure can be thwarted by using only the test mode of a secure chip. In this work we show how a Test-Mode-Only (TMO) attack can overcome the constraints imposed by a mode-reset countermeasure and demonstrate TMO attacks on private key as well as public key ciphers.
Keywords :
design for testability; private key cryptography; public key cryptography; DfT infrastructure; TMO attack; design for testability; hardware implementation; mode-reset countermeasure; private key ciphers; public key ciphers; reset operation; scan attack; secret key; secure chip; test infrastructure; test responses; test-mode-only attack; Ciphers; Elliptic curve cryptography; Hardware; Registers; Standards; Switches;
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location :
Napa, CA
DOI :
10.1109/VTS.2015.7116255