DocumentCode
2740150
Title
TMO: A new class of attack on cipher misusing test infrastructure
Author
Ali, Sk Subidh ; Sinanoglu, Ozgur
Author_Institution
New York Univ. Abu Dhabi (NYUAD), Abu Dhabi, United Arab Emirates
fYear
2015
fDate
27-29 April 2015
Firstpage
1
Lastpage
4
Abstract
We present a new class of scan attack on hardware implementation of ciphers. The existing scan attacks on ciphers exploit the Design for Testability (DfT) infrastructure of the implementation, where an attacker applies cipher inputs in the functional mode and then by switching to the test mode retrieves the secret key in the form of test responses. These attacks can be thwarted by applying a reset operation when there is a switch of mode. However, the mode-reset countermeasure can be thwarted by using only the test mode of a secure chip. In this work we show how a Test-Mode-Only (TMO) attack can overcome the constraints imposed by a mode-reset countermeasure and demonstrate TMO attacks on private key as well as public key ciphers.
Keywords
design for testability; private key cryptography; public key cryptography; DfT infrastructure; TMO attack; design for testability; hardware implementation; mode-reset countermeasure; private key ciphers; public key ciphers; reset operation; scan attack; secret key; secure chip; test infrastructure; test responses; test-mode-only attack; Ciphers; Elliptic curve cryptography; Hardware; Registers; Standards; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Conference_Location
Napa, CA
Type
conf
DOI
10.1109/VTS.2015.7116255
Filename
7116255
Link To Document