Title :
Update of integrated circuit SEE responses: 2001-2002
Author_Institution :
NASA Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This tenth biennial update presents heavy ion and proton SEE (single event effects) data from various test groups over the past two years.
Keywords :
integrated circuits; proton effects; SEE testing; heavy ion SEE data; integrated circuit SEE responses; proton SEE data; proton testing; single event effects; single-event functional interrupt; single-event latchup; single-event upset; Aerospace testing; Automatic testing; Circuit testing; Laboratories; Propulsion; Protons; Radiation effects; Single event upset; Space technology; Temperature dependence;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281343
