Total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

Author

Cochran, Donna J. ; Kniffin, Scott D. ; LaBel, Kenneth A. ; O´Bryan, Martha V. ; Reed, Robert A. ; Ladbury, Ray L. ; Howard, James W., Sr. ; Poivey, Christian ; Buchner, Stephen P. ; Marshall, Cheryl J. ; Marshall, Paul W. ; Kim, Hak S. ; Hawkins, Donald

Author_Institution

QSS Group Inc., Lanham, MD, USA

fYear

2003

fDate

21-25 July 2003

Firstpage

57

Lastpage

64

Abstract

We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, analog-to-digital converters, and digital-to-analog converters, among others.

Keywords

analogue integrated circuits; analogue-digital conversion; bipolar integrated circuits; digital integrated circuits; digital-analogue conversion; electronic equipment testing; hybrid integrated circuits; optoelectronic devices; radiation effects; space vehicle electronics; NASA; analog devices; analog-to-digital converters; candidate spacecraft electronics; device testing; digital devices; digital-to-analog converters; displacement damage; hybrid devices; linear bipolar devices; optoelectronics; total ionizing dose; Aerospace electronics; Degradation; Electronic equipment testing; NASA; Performance evaluation; Radiation effects; Space technology; Space vehicles; Telephony; Test facilities;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2003. IEEE

Print_ISBN

0-7803-8127-0

Type

conf

DOI

10.1109/REDW.2003.1281345

Filename

1281345