• DocumentCode
    2740228
  • Title

    Reflected second-harmonic ellipsometry - a new tool for determining the nonlinear optical coefficients of thin films

  • Author

    Kondo, Toshiaki ; Koh, S. ; Tsunoda, Takahiro ; Okubo, A. ; Shiraki, Yasuhiro ; Ito, Ryouta

  • Author_Institution
    The University of Tokyo
  • fYear
    1994
  • fDate
    29 Aug-2 Sep 1994
  • Firstpage
    262
  • Lastpage
    263
  • Keywords
    Ellipsometry; Frequency conversion; Laser beams; Nonlinear optical devices; Nonlinear optics; Optical films; Optical modulation; Optical polarization; Optical pumping; Optical saturation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics Conference, 1994., Proceedings of 5th European
  • Print_ISBN
    0-7803-1791-2
  • Type

    conf

  • DOI
    10.1109/EQEC.1994.698478
  • Filename
    698478
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2740228