DocumentCode :
2740228
Title :
Reflected second-harmonic ellipsometry - a new tool for determining the nonlinear optical coefficients of thin films
Author :
Kondo, Toshiaki ; Koh, S. ; Tsunoda, Takahiro ; Okubo, A. ; Shiraki, Yasuhiro ; Ito, Ryouta
Author_Institution :
The University of Tokyo
fYear :
1994
fDate :
29 Aug-2 Sep 1994
Firstpage :
262
Lastpage :
263
Keywords :
Ellipsometry; Frequency conversion; Laser beams; Nonlinear optical devices; Nonlinear optics; Optical films; Optical modulation; Optical polarization; Optical pumping; Optical saturation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1994., Proceedings of 5th European
Print_ISBN :
0-7803-1791-2
Type :
conf
DOI :
10.1109/EQEC.1994.698478
Filename :
698478
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2740228
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