Title :
Single event effects results for candidate spacecraft electronics for NASA
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Howard, James W., Jr. ; Poivey, Christian ; Ladbury, Ray L. ; Kniffin, Scott D. ; Buchner, Stephen P. ; Xapsos, Michael ; Reed, Robert A. ; Sanders, Anthony B. ; Seidleck, Christina M. ; Marshall, Cheryl J. ; Marsh
Author_Institution :
Raytheon Inf. Technol. & Sci. Services, NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Keywords :
analogue integrated circuits; bipolar integrated circuits; digital integrated circuits; electronic equipment testing; hybrid integrated circuits; optoelectronic devices; proton effects; space vehicle electronics; NASA; analog devices; candidate spacecraft electronics; device testing; digital devices; heavy ion SEE; hybrid devices devices; linear bipolar devices; proton SEE; single event effects; Aerospace electronics; Laboratories; NASA; Protons; Single event upset; Space technology; Space vehicles; Telephony; Testing; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281346
