Title :
Improving Boolean Circuit Testing by using Quantum Search
Author :
Chou, Yao-Hsin ; Kuo, Sy-Yen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
Abstract :
Given any classical circuit, a minimum input quantum version of boolean circuit can be constructed with general CCN gates. Any quantum boolean circuit can be easily tested with one test pattern under stuck-at fault model. In this paper, we apply quantum search algorithm to boolean logic testing problem and drastically decrease not only the number of test patterns but also the time and the number of bits we needed to find out the faulty wires.
Keywords :
fault diagnosis; logic testing; quantum gates; CCN gates; boolean logic testing; classical circuit; faulty wires; input quantum version; quantum boolean circuit testing; quantum search algorithm; stuck-at fault model; Boolean functions; Circuit faults; Circuit testing; Contacts; Integrated circuit interconnections; Logic arrays; Logic circuits; Logic testing; Parallel processing; Wires;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.185
