Spectroscopic s-SNOM powered by infrared frequency-combs

Author

Brehm, M. ; Schliesser, A. ; Keilmann, F.

Author_Institution

Max-Planck-lnst. fur Biochemie, Martinsried

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

364

Lastpage

364

Abstract

We report the application of a new type of Fourier-transform spectroscopy called coherent frequency-comb FTIR. This new spectrometer is used to illuminate and read out a scanning mid-infared near-field microscope. The latter is based on an AFM with commercial, cantilevered tips and works on the principle of light scattering; thus it is named scattering or s-SNOM. As a result, we obtain mid-infrared spectra for each pixel of the scanned image. The spatial resolution is typically 30 nm, but 10 nm appears feasible in the near future.

Keywords

Fourier transform spectroscopy; infrared spectroscopy; light scattering; near-field scanning optical microscopy; Fourier-transform spectroscopy; coherent frequency-comb FTIR; infrared frequency-combs; light scattering; mid-infrared spectra; scanning mid-infared near-field microscope; scattering-type optical near-field microscopy; spatial resolution; spectroscopic s-SNOM; Atomic force microscopy; Chemicals; Frequency; Infrared detectors; Infrared imaging; Infrared spectra; Optical scattering; Pixel; Resonance light scattering; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368572

Filename

4222306