Title :
2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125)
Abstract :
The following topics were dealt with: materials technology; novel circuits; SOI process development; devices and device modeling; circuit applications; novel devices; reliability
Keywords :
silicon-on-insulator; SOI technology;
Conference_Titel :
SOI Conference, 2000 IEEE International
Conference_Location :
Wakefield, MA, USA
Print_ISBN :
0-7803-6389-2
DOI :
10.1109/SOI.2000.892740
