• DocumentCode
    2740465
  • Title

    Improving the accuracy of defect diagnosis by considering reduced diagnostic information

  • Author

    Pomeranz, Irith

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2015
  • fDate
    27-29 April 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    It was noted earlier that the accuracy of defect diagnosis may be improved if certain tests are removed from consideration by the defect diagnosis procedure. This paper observes that the effects, which support the removal of tests, also support the removal of observable outputs from consideration during defect diagnosis. Specifically, a test may create an output response that a defect diagnosis procedure will not be able to interpret correctly. This may affect some observable outputs more strongly than others. Therefore, the removal of observable outputs from consideration can improve the accuracy of diagnosis. This paper describes a generalized augmented defect diagnosis procedure that removes tests and observable outputs from consideration. It presents experimental results to demonstrate the effects of removing observable outputs on the accuracy of diagnosis.
  • Keywords
    fault diagnosis; integrated circuit testing; defect diagnosis procedure; reduced diagnostic information; Accuracy; Circuit faults; Computational modeling; IEEE Computer Society; Integrated circuit modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2015 IEEE 33rd
  • Conference_Location
    Napa, CA
  • Type

    conf

  • DOI
    10.1109/VTS.2015.7116270
  • Filename
    7116270