DocumentCode
2740485
Title
Microelectronics application for GBR-X testability
Author
Raduziner, David ; Toomey, Paul ; Torina, Mike
Author_Institution
Raytheon Co., Wayland, MA, USA
fYear
1991
fDate
12-13 Mar 1991
Firstpage
26
Lastpage
30
Abstract
A summary is presented of the testability developments under a major US Army radar project, ground based radar-experimental (GBR-X), giving requirements derivation and allocation, design methodology, descriptions of the application to one of the major hardware items using the distributed microprocessors within it, and the discipline testability program and results. Testability and diagnostics requirements for GBR-X are derived from the mission availability and dependability specifications using a model based on the mission time line. The parametric results of the analysis show that for GBR-X premission check-out efficiency is the dominant factor, with online fault detection also significant. It is concluded that the development of a very complicated and large system using hardware varying in design maturity from off-the-shelf to dedicated newly designed hardware can be controlled to provide a high level of predicated testability by the interaction of testability considerations into the early conceptual stages of system and circuit design
Keywords
automatic test equipment; distributed processing; military computing; military systems; radar systems; GBR-X; US Army radar project; design; diagnostics requirements; distributed microprocessors; ground based radar-experimental; microelectronics application; mission availability; mission dependability; mission time line; online fault detection; premission check-out efficiency; requirements allocation; requirements derivation; test firmware; testability program; Circuit synthesis; Circuit testing; Control systems; Design methodology; Fault detection; Hardware; Microelectronics; Microprocessors; Radar applications; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar Conference, 1991., Proceedings of the 1991 IEEE National
Conference_Location
Los Angeles, CA
Print_ISBN
0-87942-629-2
Type
conf
DOI
10.1109/NRC.1991.114718
Filename
114718
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