A Compact Electronically-Tuned Vector Measurement System For Submillimeter-Wave Imaging

An electronically tunable compact submillimeter wave transmission/reflection measurement system has been demonstrated at 560-635 GHz. The measured dynamic range is as high as 90 dB (60 dB across the entire frequency range), with less than 2deg of peak phase noise. The frequency agility of the system can be exploited to provide near real-time imaging capability using only a single pixel. This is accomplished by scanning the transmit and receive beams through the use of a frequency steerable lens placed at the transmitter and receiver.