DocumentCode :
2740611
Title :
Influence of Electroless Copper on IC Reliability
Author :
Magaya, Tafadzwa
Author_Institution :
Atotech Deutschland GmbH, Berlin
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
414
Lastpage :
416
Abstract :
The process of plating through holes (PTH) is inherent to modern PCB manufacturing. In an arena of increasing circuit density and layer counts, the reliability of the PTH process is under constant microscopic examination. The aim of electroless copper is to plate a conductive layer through a hole or into a blind microvia. In this context an interconnect (IC) refers to the copper to copper adhesion within the functional constraints of a circuit board. As these can include many inner layers, the inter connection quality is of prime concern. In addition the PTH process also inherits the issues from the preceding manufacture.
Keywords :
integrated circuit reliability; integrated circuit testing; printed circuit testing; IC reliability; PCB manufacturing; PTH process; blind microvia; conductive layer; electroless copper; interconnect; plating through holes; Copper; Drilling; Environmentally friendly manufacturing techniques; Lead; Manufacturing processes; Modems; Soldering; Temperature; Thermal stresses; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microsystems, Packaging, Assembly & Circuits Technology Conference, 2008. IMPACT 2008. 3rd International
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3623-1
Electronic_ISBN :
978-1-4244-3624-8
Type :
conf
DOI :
10.1109/IMPACT.2008.4783900
Filename :
4783900
Link To Document :
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