Title :
Single event effects hardening and characterization of Honeywell´s RHPPC integrated circuit
Author :
Lintz, J.P. ; Hoffmann, L.F. ; Bastyr, D.J. ; Brown, G.R. ; Nelson, D.K.
Author_Institution :
Honeywell Defense & Space Electron. Syst., Clearwater, FL, USA
Abstract :
We describe SEE testing of Honeywell´s radiation-hardened RHPPC processor chip, which is functionally and pin-compatible with the commercial PowerPC603e™. Results support an upset rate of 1.1×10-5 upsets/chip-day in geosynchronous orbit.
Keywords :
cosmic rays; integrated circuits; microprocessor chips; radiation hardening (electronics); space vehicle electronics; Air Force Research Laboratory; CREME96; PowerPC603e; RHPPC processor chip; SEE hardening; SEE testing; geosynchronous orbit; integrated circuit; pin compatibility; processor chip evaluation; processor chip testing; single board spacecraft computers; single event effects; solar minimum galactic cosmic ray; upset rate; Aerospace testing; CMOS process; Circuit testing; Clocks; Energy loss; Phase locked loops; Radiation hardening; Registers; Silicon; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281369
