Title :
Compendia of TID and SEE test results of space qualified integrated circuits
Author :
Layton, Phil ; Williamson, Gale ; Patnaude, Ed ; Longden, Larry ; Thibodeau, Chad ; Kazak, Boris ; Sloan, Clarence
Author_Institution :
Maxwell Technol., San Diego, CA, USA
Abstract :
SEE and TID data taken for existing and potential space products is presented. The data was collected to evaluate these devices for radiation effects in space environments.
Keywords :
integrated circuit testing; integrated circuits; radiation effects; space vehicle electronics; SEE testing; TID testing; heavy ion accelerator facilities; radiation effects; single event effects; single event latchup; single event upset; space environments; space products; space qualified integrated circuits; total ionizing dose; Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Performance evaluation; Production; Radiation effects; Single event upset; Space technology; Threshold voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2003. IEEE
Print_ISBN :
0-7803-8127-0
DOI :
10.1109/REDW.2003.1281372
