DocumentCode
2740719
Title
Evaluating Performance Tradeoff in Defect-Tolerant Gate Programming Techniques for the Clock-Free Nanowire Crossbar Architecture
Author
Bonam, Ravi ; Choi, Minsu
Author_Institution
Dept of ECE, Missouri Univ. of Sci. & Technol., Rolla, MO
fYear
2008
fDate
18-21 Aug. 2008
Firstpage
688
Lastpage
691
Abstract
A novel asynchronous nanowire crossbar architecture has been recently proposed by authors´ research group. The proposed clock-free architecture provides numerous significant benefits over its clocked counterparts which include better manufacturability, scalability, modularity and robustness. We also proposed various gate mapping and reconfiguration algorithms for defect-tolerant programming of PGMB (programmable gate macro blocks) - which is the primary building block of the proposed architecture. These algorithms were tested by simulations and a variety of parameter values were applied to show their performance characteristics. The most important performance metric of the proposed techniques is the programmability (i.e., the ratio of successfully programmed gates to the total number of gates). However, algorithms with higher programmability should come with higher time/space requirements. In this work, we will evaluate the tradeoff between programmability and time/space requirements and suggest a way to find the most suitable algorithm with acceptable combination of programmability and time/space requirements.
Keywords
asynchronous circuits; logic gates; nanoelectronics; nanowires; clock-free nanowire crossbar architecture; defect-tolerant gate programming; gate mapping; manufacturability; modularity; programmable gate macroblocks; reconfiguration algorithms; robustness; scalability; time-space requirements; Boolean functions; Clocks; Costs; Extremities; Logic gates; Manufacturing; Measurement; Robustness; Scalability; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location
Arlington, TX
Print_ISBN
978-1-4244-2103-9
Electronic_ISBN
978-1-4244-2104-6
Type
conf
DOI
10.1109/NANO.2008.208
Filename
4617190
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