• DocumentCode
    2740719
  • Title

    Evaluating Performance Tradeoff in Defect-Tolerant Gate Programming Techniques for the Clock-Free Nanowire Crossbar Architecture

  • Author

    Bonam, Ravi ; Choi, Minsu

  • Author_Institution
    Dept of ECE, Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    688
  • Lastpage
    691
  • Abstract
    A novel asynchronous nanowire crossbar architecture has been recently proposed by authors´ research group. The proposed clock-free architecture provides numerous significant benefits over its clocked counterparts which include better manufacturability, scalability, modularity and robustness. We also proposed various gate mapping and reconfiguration algorithms for defect-tolerant programming of PGMB (programmable gate macro blocks) - which is the primary building block of the proposed architecture. These algorithms were tested by simulations and a variety of parameter values were applied to show their performance characteristics. The most important performance metric of the proposed techniques is the programmability (i.e., the ratio of successfully programmed gates to the total number of gates). However, algorithms with higher programmability should come with higher time/space requirements. In this work, we will evaluate the tradeoff between programmability and time/space requirements and suggest a way to find the most suitable algorithm with acceptable combination of programmability and time/space requirements.
  • Keywords
    asynchronous circuits; logic gates; nanoelectronics; nanowires; clock-free nanowire crossbar architecture; defect-tolerant gate programming; gate mapping; manufacturability; modularity; programmable gate macroblocks; reconfiguration algorithms; robustness; scalability; time-space requirements; Boolean functions; Clocks; Costs; Extremities; Logic gates; Manufacturing; Measurement; Robustness; Scalability; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.208
  • Filename
    4617190