DocumentCode :
2740743
Title :
Growth of sprayed CIS film and post-sulfurization effects
Author :
Lee, Dong-Yeup ; Yoo, Hyesun ; Song, Ki-Bong ; Yun, Jae Ho ; Yoon, Kyunghoon ; Kim, JunHo
Author_Institution :
Dept. of Phys., Univ. of Incheon, Incheon, South Korea
fYear :
2010
fDate :
20-25 June 2010
Abstract :
We studied CuInS2 (CIS) film growth using high electrostatic field assisted ultrasonic spray deposition. All the sprayed CIS films were observed to be grown with mixed ordering mode, where chalcopyrite (CH) and CuAu (CA) orderings coexisted. For the high efficiency solar cell, CH-ordered CIS film is desirable. We performed post-sulfurization for all as-sprayed films to induce recrystallization. After post-sulfurization of as-sprayed films, CH-ordered phase was significantly increased. For Cu-rich CIS films, the CH-fraction was increased to be ~0.8. The scanning electron microscopy measurement revealed that grain size was also increased after post-sulfurization. These results indicate that spray deposition could be utilized for the fabrication of high quality CIS photo absorbing films.
Keywords :
copper compounds; electric fields; grain size; indium compounds; recrystallisation; scanning electron microscopy; semiconductor thin films; solar cells; ternary semiconductors; CuAu orderings; CuInS2; chalcopyrite; electrostatic field; grain size; mixed ordering mode; post-sulfurization effects; recrystallization; scanning electron microscopy; solar cell; sprayed CIS film growth; ultrasonic spray deposition; Phase measurement; Scanning electron microscopy; Size measurement; Temperature measurement; Ultrasonic variables measurement; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
Conference_Location :
Honolulu, HI
ISSN :
0160-8371
Print_ISBN :
978-1-4244-5890-5
Type :
conf
DOI :
10.1109/PVSC.2010.5614636
Filename :
5614636
Link To Document :
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