Title :
Single-Electron Arithmetic Circuits for Sigma-Delta Domain Signal Processing
Author :
Katao, Tsubasa ; Suzuki, Yoshinao ; Fujisaka, Hisato ; Kamio, Takeshi ; Ahn, Chang-Jun ; Haeiwa, Kazuhisa
Author_Institution :
Fac. of Inf. Sci., Hiroshima City Univ., Hiroshima
Abstract :
This paper presents single-electron arithmetic circuits for sigma-delta domain signal processing. Sigma-delta domain signal processing is one of hardware architectures which have tolerance for transient device errors. Results of circuit simulation show that the errors never trigger out-of-control state of the circuits and random surge of their outputs.
Keywords :
circuit simulation; logic circuits; logic simulation; sigma-delta modulation; circuit simulation; hardware architecture; out-of-control state; random surge; sigma-delta domain signal processing; single-electron arithmetic circuits; transient device error tolerance; Arithmetic; Circuit simulation; Clocks; Delta-sigma modulation; Digital modulation; Digital signal processors; Error correction; Hardware; Signal processing; Surges;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.219
