DocumentCode
2741138
Title
Dielectric Losses in SiC at Millimeter Wavelengths
Author
Dutta, J.M. ; Yu, Guofen ; Jones, C.R.
Author_Institution
North Carolina Central Univ., Durham
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
411
Lastpage
411
Abstract
Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.
Keywords
dielectric losses; gyrotrons; millimetre wave tubes; silicon compounds; SiC; dielectric losses; gyrotron window; loss mechanisms; millimeter wavelengths; semi-insulating SiC wafers; Data analysis; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Millimeter wave measurements; Performance evaluation; Silicon carbide; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368619
Filename
4222353
Link To Document