Title :
Dielectric Losses in SiC at Millimeter Wavelengths
Author :
Dutta, J.M. ; Yu, Guofen ; Jones, C.R.
Author_Institution :
North Carolina Central Univ., Durham
Abstract :
Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.
Keywords :
dielectric losses; gyrotrons; millimetre wave tubes; silicon compounds; SiC; dielectric losses; gyrotron window; loss mechanisms; millimeter wavelengths; semi-insulating SiC wafers; Data analysis; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Millimeter wave measurements; Performance evaluation; Silicon carbide; Wavelength measurement;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368619
