Title :
Study of photoexcited carriers in semi-insulating InP by means of Raman spectroscopy
Author :
Artus, L. ; Cusco, R. ; Ibanez, J. ; Gonzalez-Diaz, G.
Author_Institution :
CSIC, Inst. Jaume Almera, Barcelona, Spain
Abstract :
We present a study of photoexcited plasmons in semi-insulating, Fe-doped InP at room temperature and at 80 K by means of Raman spectroscopy. Two peaks are detected in the frequency region of the LO mode. Whereas the low-energy peak does not change with incident laser power, the high-energy peak shifts to higher energies with increasing laser power, and therefore is assigned to the L+ branch of the LO-plasmon coupled mode. The LO and the L+ modes could be resolved at room temperature for high incident power, and were clearly resolved at 80 K for all the incident powers studied. The Raman spectra were fitted using a L+ lineshape model based on the Lindhard-Mermin dielectric function, in which contributions from electron, heavy-hole and light-hole intraband transitions as well as heavy-hole-light-hole interband transitions were taken into account. The fitting procedure allows us to determine the photoexcited plasma density as a function of the incident laser power
Keywords :
III-V semiconductors; Raman spectra; dielectric function; indium compounds; iron; phonon-plasmon interactions; semiconductor plasma; spectral line breadth; 20 C; 80 K; Fe-doped InP; InP:Fe; L+ branch; LO mode; LO-plasmon coupled mode; Lindhard-Mermin dielectric function; Raman spectra; Raman spectroscopy; electron intraband transitions; heavy-hole intraband transitions; heavy-hole-light-hole interband transitions; high-energy peak; laser power; light-hole intraband transitions; lineshape model; low-energy peak; photoexcited carriers; photoexcited plasma density; photoexcited plasmons; room temperature; semi-insulating InP; Frequency; Indium phosphide; Laser modes; Laser transitions; Optical coupling; Plasma temperature; Plasmons; Power lasers; Raman scattering; Spectroscopy;
Conference_Titel :
Compound Semiconductors, 1997 IEEE International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7503-0556-8
DOI :
10.1109/ISCS.1998.711639