DocumentCode :
2741292
Title :
Comparative analysis of PD-SOI active body-biasing circuits
Author :
Casu, R. ; Masera, G. ; Piccinini, C. ; Roch, M. Ruo ; Zamboni, M.
Author_Institution :
Dept. of Electron., Politecnico di Torino, Italy
fYear :
2000
fDate :
2000
Firstpage :
94
Lastpage :
95
Abstract :
The body of SOI partially depleted MOSFETs can be biased to control the threshold dynamically. In the dynamic threshold MOSFET (DTMOS) (Assaderaghi et al, 1997), the operation is limited to about V dd=0.7 V because of the forward bias of the B-D and B-S junctions. Active body-biasing circuits (ABC-SOI) use auxiliary transistors to implement the bias circuitry and to increase the Vdd limit (Chuang et al., 1998; Chung et al., 1997; Gil et al., 1998; Lee et al., 1998). In this paper, previously reported and new ABCs are analyzed. The speed-power trade-off and the delay stability, one of the most peculiar PD problems, are examined in several operating conditions
Keywords :
MOS integrated circuits; MOSFET; active networks; circuit simulation; circuit stability; delays; high-speed integrated circuits; logic gates; low-power electronics; silicon-on-insulator; 0.7 V; ABC-SOI; B-D junction; B-S junction; DTMOS; PD-SOI active body-biasing circuits; SOI partially depleted MOSFET body bias; SOI partially depleted MOSFETs; Si-SiO2; active body-biasing circuits; auxiliary transistors; bias circuitry; delay stability; dynamic threshold MOSFET; dynamic threshold control; forward bias; operating conditions; speed-power trade-off; Circuit simulation; Circuit stability; Circuit testing; Delay; Diodes; Energy consumption; Immune system; Inverters; Stability analysis; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 2000 IEEE International
Conference_Location :
Wakefield, MA
ISSN :
1078-621X
Print_ISBN :
0-7803-6389-2
Type :
conf
DOI :
10.1109/SOI.2000.892786
Filename :
892786
Link To Document :
بازگشت