Title :
FITD Simulation of Terahertz Near-Field Microscopes
Author :
Lee, K. ; Yun, S. ; Cho, M. ; Park, H. ; Kim, J. ; Han, H. ; Park, I.
Author_Institution :
Pohang Univ. of Sci. & Technol., Pohang
Abstract :
The spatial resolutions of conventional THz TDS systems are limited by diffraction. In this work, we present a numerical analysis of apertureless THz pulse near-field microscopy (NFM), and successfully demonstrate that the THz NFM can have nanometer-scale resolution. For the numerical analysis we used CST MWS, a commercial software based on finite integral time domain (FITD) method. It is found that the THz near field is strongly localized around the probe tip as expected, which is of importance for nanometer resolution.
Keywords :
finite difference time-domain analysis; light diffraction; near-field scanning optical microscopy; FITD simulation; finite integral time domain; light diffraction; nanometer scale resolution; numerical analysis; pulse near field microscopy; spatial resolutions; terahertz near field microscopes; Biotechnology; Diffraction; Energy resolution; Integral equations; Microscopy; Nanotechnology; Numerical analysis; Probes; Spatial resolution; Submillimeter wave technology;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368643
