• DocumentCode
    2741617
  • Title

    Influence of slits spacing on the terahertz transmission properties of double sub-wavelength metallic slits

  • Author

    Cui, Weili ; Han, Yuan ; Zhang, Yan ; Zhang, Cunlin

  • Author_Institution
    Capital Normal Univ., Beijing
  • fYear
    2006
  • fDate
    18-22 Sept. 2006
  • Firstpage
    436
  • Lastpage
    436
  • Abstract
    In this paper, the influence of slits spacing on the terahertz transmission properties of double metallic slits is investigated experimentally. THz TDS is used to measure the transmission properties of two polarized THz radiation (TM polarization and TE polarization). Structures fabricated in the copper film with thickness of 60 mum are examined. For the TE mode, non-resonant transmission features are present. However, the position of the minimal transmissivity can be varied with the slits spacing. In the case of the TM mode, the resonant transmission of the double slits has been demonstrated. Furthermore, it is shown that the position of the resonant peak is related to the slits spacing. This effect may be interpreted as the coupling of THz radiation with waveguide resonances located in the slits.
  • Keywords
    copper; electromagnetic wave polarisation; metallic thin films; submillimetre wave spectra; TE polarization; THz TDS; TM polarization; copper film; double subwavelength metallic slits; non-resonant transmission features; polarized THz radiation; slits spacing; terahertz transmission properties; waveguide resonances; Copper; Frequency; Optical films; Optical waveguides; Polarization; Resonance; Submillimeter wave measurements; Submillimeter wave technology; Tellurium; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0400-2
  • Electronic_ISBN
    1-4244-0400-2
  • Type

    conf

  • DOI
    10.1109/ICIMW.2006.368644
  • Filename
    4222378