DocumentCode :
2741634
Title :
Methods to Measure Material Viscoelastic Properties using Sharp, Flat and Buckling Tips inside ESEM
Author :
Ahmad, Mohd Ridzuan ; Nakajima, Masahiro ; Kojima, Seiji ; Homma, Michio ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya
fYear :
2008
fDate :
18-21 Aug. 2008
Firstpage :
857
Lastpage :
860
Abstract :
Methods to measure the viscoelastic property of time- dependent materials are proposed using sharp, flat and buckling tips inside Environmental Scanning Electron Microscope (ESEM). Single W303 yeast cells were employed in the study. All of the tips were used to indent into the material in nanoindentation tests. Three loading histories were used: (1) a ramp loading history, in which a sharp indenter was used; (2) a step loading history, in which a flat indenter was implemented; and (3) a fast unloading history, in which a buckling nanoneedle was applied. Analysis of the viscoelastic material response was performed for each of the loading history by choosing an appropriate theory between the correspondence principle and the functional equation. Results from each of the tests show good agreement, in which more strong conclusion can be obtained.
Keywords :
biomechanics; cellular biophysics; indentation; microorganisms; nanobiotechnology; scanning electron microscopy; viscoelasticity; ESEM; buckling nanoneedle; buckling tip; correspondence principle; environmental scanning electron microscopy; fast unloading history; flat tip; functional equation; material viscoelastic properties; nanoindentation tests; ramp loading history; sharp tip; single W303 yeast cells; step loading history; time-dependent materials; Biological materials; Biomedical engineering; Biomedical measurements; Elasticity; Equations; History; Materials testing; Nanobioscience; Scanning electron microscopy; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, Texas
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
Type :
conf
DOI :
10.1109/NANO.2008.256
Filename :
4617238
Link To Document :
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