Title :
Estimation of peak current through CMOS VLSI circuit supply lines
Author :
Murayama, Toshio ; Ogawa, Kimihiro ; Yamaguchi, Haruhiko
Author_Institution :
Sony Corp., Atsugi, Japan
Abstract :
We present a new approach for estimating the maximum instantaneous current through the power supply lines of CMOS VLSI circuits. Our final goal is to determine the peak currents and voltage drops through power supply lines of real VLSI circuits within a practical time. Our approach is based on the iMax algorithm of estimating the upper bound of the current, and uses an improved timed ATPG-based algorithm to obtain a tight lower bound. In order to handle sequential circuits, we equate latch outputs with primary inputs for the upper bound estimation and use a logic simulator to determine the initial values for the lower bound estimation. Based on the information obtained, we model all blocks in the circuit as voltage-controlled current sources, with the analog hardware description language (AHDL). After extracting parasitic resistances of the power supply lines, we simulate the entire circuit using an analog simulator and obtain the maximum current estimation and voltage drops in the supply lines. In the modeling procedure we take the negative feedback influence into consideration such that the estimated current reflects a real switching transition. We have implemented the theoretically modeled negative feedback influence into our simulator called PANGI. Some experimental results of applying PANGI to the circuits which consist of more than 1M gates prove the accuracy and reliability of our approach
Keywords :
CMOS logic circuits; VLSI; active networks; analogue simulation; automatic test pattern generation; circuit feedback; hardware description languages; integrated circuit testing; power supply circuits; sequential circuits; ATPG; CMOS VLSI circuit; PANGI; analog hardware description language; current estimation; iMax algorithm; logic simulator; maximum instantaneous current; negative feedback; parasitic resistances; peak current; peak currents; power supply lines; real VLSI circuits; sequential circuits; upper bound; voltage drop; voltage-controlled current sources; Circuit simulation; Data mining; Hardware design languages; Latches; Negative feedback; Power supplies; Sequential circuits; Upper bound; Very large scale integration; Voltage;
Conference_Titel :
Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific
Conference_Location :
Wanchai
Print_ISBN :
0-7803-5012-X
DOI :
10.1109/ASPDAC.1999.760017