Title :
On the testing quality of random and pseudo-random sequences for permanent and intermittent faults
Author :
Ding, Jin ; Yu-Liang
Author_Institution :
Dept. of Telecommun., Beijing Univ. of Posts & Telecommun., China
Abstract :
In this paper, the natures of random and pseudo-random input sequences and their influence on permanent and intermittent fault detecting are analyzed. The aliasing fault coverage between the pseudo-random and random sequences is estimated. The activity probability features of the intermittent faults are considered. The self-test circuits of the intermittent faults are illustrated. The experimental results based on real circuits are obtained through simulation. The mathematical analysis and experimental results show that the quality of the pseudo-random testing is better than that of the random testing for permanent and intermittent faults. The Markov chain models are used in obtaining the input sequence length needed for determining if a circuit fault is intermittent or permanent
Keywords :
Markov processes; built-in self test; digital integrated circuits; integrated circuit testing; logic testing; probability; sequences; BIST; Markov chain models; activity probability; aliasing fault coverage; circuit fault; input sequence length; intermittent faults; permanent faults; pseudo-random sequences; random sequences; self-test circuits; testing quality; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Mathematical analysis; Random sequences; Telecommunications; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1999. Proceedings of the ASP-DAC '99. Asia and South Pacific
Conference_Location :
Wanchai
Print_ISBN :
0-7803-5012-X
DOI :
10.1109/ASPDAC.1999.760021