DocumentCode
2741818
Title
High frequency input isolation circuit for asynchronous CMOS macros in PD/SOI technology
Author
Joshi, R.V. ; Hwang, W. ; Chuang, C.T.
Author_Institution
IBM Res. Div., T.J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2000
fDate
2000
Firstpage
140
Lastpage
141
Abstract
The circuit techniques presented in this paper are particularly useful for self-resetting CMOS (SRCMOS) (Henkels et al, 1999) designs in a partially depleted (PD) SOI technology, where pulse width alignment and control becomes much more difficult due to the hysteresis effect in floating body devices. Static and dynamic input isolation circuits are provided at the interface of the macro boundary in asynchronous CMOS design to render the input pulses within the specification. The technique does not require handshaking or interlock signals and is shown to improve the robustness of SRCMOS macros, especially in PD/SOI technology. The robustness of the circuit is demonstrated across a wide range of temperatures, Leffs and operating frequencies over 3 GHz with a minimum input pulse width of 0.2 ns
Keywords
CMOS logic circuits; asynchronous circuits; circuit simulation; hysteresis; integrated circuit design; integrated circuit reliability; logic design; logic simulation; silicon-on-insulator; 0.2 ns; 2 ns; 3 GHz; PD/SOI technology; SRCMOS design; SRCMOS macro robustness; SRCMOS macros; Si-SiO2; asynchronous CMOS design; asynchronous CMOS macros; circuit techniques; dynamic input isolation circuits; effective channel length; floating body devices; high frequency input isolation circuit; hysteresis effect; input pulses; macro boundary interface; minimum input pulse width; operating frequencies; partially depleted SOI technology; pulse width alignment; pulse width control; self-resetting CMOS design; static input isolation circuits; thermal robustness; CMOS technology; Circuit simulation; Frequency; Hysteresis; Isolation technology; Isolators; Pulse circuits; Pulse generation; Space vector pulse width modulation; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
SOI Conference, 2000 IEEE International
Conference_Location
Wakefield, MA
ISSN
1078-621X
Print_ISBN
0-7803-6389-2
Type
conf
DOI
10.1109/SOI.2000.892809
Filename
892809
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