Title :
A Quantitative Approach for Analysis of Defect Tolerance in QCA
Author :
Dai, Jianwei ; Wang, Lei ; Jain, Faquir
Author_Institution :
Dept. of Electr. & Comput. Eng., Connecticut, Univ., Storrs, CT
Abstract :
Quantum dot cellular automata (QCA) is one of the emerging nanotechnologies for the design of next generation nanocomputing systems. However, excessive defects at the device level are expected to become a fundamental obstacle for achieving reliable computation in QCA-based integrated systems. In this paper, we present an information-theoretic approach to investigate the relationship between defect tolerance and the redundancy inherent in QCA systems. The proposed method allows us to evaluate the effectiveness of redundancy-based defect tolerance in a quantitative manner.
Keywords :
cellular automata; information theory; nanoelectronics; quantum computing; quantum dots; reliability; QCA-based integrated systems; defect tolerance analysis; information theoretic approach; nanocomputing systems; nanotechnologies; quantum dot cellular automata; redundancy-based defect tolerance; reliable computating; CMOS technology; Circuits; Clocks; Electrons; Logic; Polarization; Quantum cellular automata; Quantum dots; Redundancy; Stationary state;
Conference_Titel :
Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
Conference_Location :
Arlington, TX
Print_ISBN :
978-1-4244-2103-9
Electronic_ISBN :
978-1-4244-2104-6
DOI :
10.1109/NANO.2008.270
