Title :
Infrared Optical Properties of Bi4-xNdxTi3O12 Thin Films Prepared by a Chemical Solution Method
Author :
Ma, Jian Hua ; Xue, Jian Qiang ; Meng, Xiang Jian ; Sun, Jing Lan ; Lin, Tie ; Shi, Fu Wen ; Chu, Jun Hao
Author_Institution :
Chinese Acad. of Sci., Shanghai
Abstract :
Infrared optical properties of Bi4-xNdxTi3O12 [BNT(x=0,0.25,0.50,0.75)] thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5-11.4mum (0.11-0.50eV). Their refractive index decreased and extinction coefficient increased as the wavelength increased. Both the refractive index and the extinction coefficient decreased as the concentration of Nd increased. In addition, the wavelength and Nd concentration dependence of the absorption coefficient showed the similar behavior to that of the extinction coefficient.
Keywords :
bismuth compounds; extinction coefficients; ferroelectric thin films; infrared spectra; liquid phase deposition; neodymium compounds; Bi4NdTi3O12; absorption coefficient; chemical solution method; electron volt energy 0.11 eV to 0.50 eV; extinction coefficient; infrared optical properties; infrared spectroscopic ellipsometry; refractive index; thin films; wavelength 2.5 micron to 11.4 micron; Bismuth; Chemicals; Extinction coefficients; Infrared spectra; Neodymium; Optical films; Optical refraction; Optical variables control; Refractive index; Spectroscopy;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368662
