DocumentCode :
2742131
Title :
Pentium(R) Pro processor design for test and debug
Author :
Carbine, Adrian ; Feltham, Derek
Author_Institution :
Intel Corp., Hillsboro, OR, USA
fYear :
1997
fDate :
1-6 Nov 1997
Firstpage :
294
Lastpage :
303
Abstract :
This paper describes the Design for Test (DFT) and silicon debug features of the Pentium(R) Pro processor, and its production test development methodology. The need to quickly ramp a complex, high-performance microprocessor into high-volume manufacturing with low defect rates led the design team to a custom low-area DFT approach, coupled with a manually-written test methodology which targeted several fault models. Results show that this approach was effective in balancing testability needs with other design constraints, while enabling excellent time to market and test quality
Keywords :
built-in self test; computer testing; design for testability; integrated circuit testing; microprocessor chips; production testing; CPU performance; Pentium(R) Pro processor design; cooling; custom low-area DFT; defect rates; fault models; high-performance microprocessor; high-volume manufacturing; silicon debug; testability; time to market; Circuit testing; Design for testability; Microprocessors; Portfolios; Process design; Production; Silicon; Time to market; Virtual manufacturing; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-4209-7
Type :
conf
DOI :
10.1109/TEST.1997.639630
Filename :
639630
Link To Document :
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