DocumentCode :
2742321
Title :
Studies of BaO-Nd2O3-TiO3 thin films by RF Sputter and its TMLs
Author :
Bi-yan, Wu ; Shu-rong, Dong
Author_Institution :
Zhejiang Gongshang Univ., Hangzhou
fYear :
2006
fDate :
18-22 Sept. 2006
Firstpage :
473
Lastpage :
473
Abstract :
As a high permittivity and low loss ceramic, BaO-Nd2O3-TiO3 (BNT) is widely used in millimeter wave dielectric resonator. Perfect BNT thin films are obtained by through high density plasma RF sputter, and compared dielectric properties with bulk. The results show that underlay temperature has mainly effect on thin films. The optimize technology is gotten. Through simulation, thin film microstrip line based on BNT has more high integration and more excellent microwave dielectric loss properties than standard microstrip Line.
Keywords :
barium compounds; ceramics; dielectric losses; dielectric resonators; dielectric thin films; microstrip lines; microwave materials; millimetre wave devices; neodymium compounds; permittivity; sputtered coatings; thin films; BNT thin films; BaO-Nd2O3-TiO3; RF sputter; high permittivity ceramic; low loss ceramic; microstrip line; microwave dielectric loss; millimeter wave dielectric resonator; Ceramics; Dielectric losses; Dielectric thin films; Microstrip; Millimeter wave technology; Permittivity; Plasma properties; Plasma temperature; Radio frequency; Sputtering; BNT; Thin Film Microstrip Line; dielectric ceramic; dielectric properties; millimeter wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
Type :
conf
DOI :
10.1109/ICIMW.2006.368681
Filename :
4222415
Link To Document :
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