Title :
Distribution-free detection under complex elliptically symmetric clutter distribution
Author :
Ollila, Esa ; Tyler, David E.
Author_Institution :
Dept. of Signal Process. & Acoust., Aalto Univ., Aalto, Finland
Abstract :
We study the constant false alarm rate matched subspace detector (CFAR MSD) of a signal observed under additive noise following a complex elliptically symmetric (CES) distribution which include the class of compound-Gaussian (CG) distributions as special cases. We prove that the detector is distribution-free under the null (signal free) hypothesis and derive simple expressions for the probability of detection assuming CG-distributed clutter. The derived theoretical results are then illustrated by contrasting them with the performance of a practical adaptive detector which estimates the shape matrix (normalized clutter covariance matrix) from the set of secondary data using complex Tyler´s M-estimator of scatter under small sample lengths. We also prove that the complex Tyler´s M-estimator is the maximum likelihood estimator (MLE) of the shape matrix under the assumption that the secondary data are independent random vectors from a possibly different CES distributions but which share the same shape matrix parameter.
Keywords :
Gaussian distribution; clutter; covariance matrices; maximum likelihood estimation; probability; signal detection; CES distribution; CFAR MSD; CG distributions; CG-distributed clutter; MLE; adaptive detector; additive noise; complex Tyler M-estimator; complex elliptically symmetric clutter distribution; compound-Gaussian distributions; constant false alarm rate matched subspace detector; distribution-free detection; independent random vectors; maximum likelihood estimator; normalized clutter covariance matrix; null hypothesis; probability of detection; shape matrix estimation; shape matrix parameter; Clutter; Covariance matrix; Detectors; Maximum likelihood estimation; Shape; Signal processing; Vectors;
Conference_Titel :
Sensor Array and Multichannel Signal Processing Workshop (SAM), 2012 IEEE 7th
Conference_Location :
Hoboken, NJ
Print_ISBN :
978-1-4673-1070-3
DOI :
10.1109/SAM.2012.6250525