Title :
Using a CISC microcontroller to test embedded memories
Author :
van de Goor, Ad ; Hamdioui, Said ; Gaydadjiev, Georgi
Author_Institution :
ComTex, Gouda, Netherlands
Abstract :
Small microcontroller-based systems are omnipresent. Often, they do not have Memory BIST (MBIST), or the MBIST is not available to the user. In such cases the CPU will be the only resource to perform at least the Power-On testing of the embedded memories. This paper highlights the capabilities and limitations of CISC architectures to apply at-speed memory tests.
Keywords :
Algorithms; Assembly; Built-in self-test; Embedded computing; Microcontrollers; Performance evaluation; Power engineering and energy; Power engineering computing; Registers; System testing;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
Conference_Location :
Vienna, Austria
Print_ISBN :
978-1-4244-6612-2
DOI :
10.1109/DDECS.2010.5491773
